SHI, Zhizhuo. Deep Learning-Based Surface Defect Detection Technology for Microdevices. HighTech and Innovation Journal, [S. l.], v. 7, n. 2, p. 732–745, 2026. DOI: 10.28991/HIJ-2026-07-02-022. Disponível em: https://hightechjournal.org/index.php/HIJ/article/view/1435. Acesso em: 2 jul. 2026.